Контакты


Профессор Левашов
Евгений Александрович

(отв. лицо НКТ «Инфраструктура»)

Альбокринов Кирилл Павлович (координатор НКТ «Инфраструктура»)

Россия, 119049, Москва,
Ленинский проспект, 4

Тел. +7 (495) 951-03-46
Факс: +7 (495) 951-03-46

Эл. почта: ncp@fp7-infra.ru


Объявления
    30 ноября 2007 года объявлены конкурсы 3-ой очереди по тематике "Инфраструктура". Крайний срок подачи заявок 29 февраля 2008 года, 19:00 московского времени.
 За подробностями следите, пожалуйста, в разделе "Конкурсы" нашего сайта или в информационном портале 7РП CORDIS.






SERMA TECHNOLOGIES

В данном разделе мы можем поместить краткую информацию о Вашей организации с предложением о партнерстве.
Для этого заполните, пожалуйста, нашу АНКЕТУ
28.01.2009

SERMA TECHNOLOGIES

Французская компания ищет партнёров для участия в 7РП.

Организация: SERMA TECHNOLOGIES

Возможный вклад в проект:
Based on our 20 years of lab experience, our SME offers service support for customers in AEROSPACE, AUTOMOTIVE, RAILWAY, ENERGY, SEMICONDUCTOR, MEMS, FABLESS for their technological needs. Particularly, we propose fast and custom expertises for Failure Analyses, Qualification and R&D support.

Our company is looking for new partners to build R&D Projects in order to develop our expertises and methodologies in collaboration with private or public organisations in the field of our customer's applications.

Our company has 5000 m2 of lab, 150 experienced people and advanced equipments in 3 expertises centers, including our Grenoble Lab, based in the MINATEC high-tech environment.

Our developments are focused especially in:
  • MEMS/NEMS : new development for characterisation and reliability assessment needed because of the limits of existing equipment
  • Near Field Application : AFM modes, Nanoscale CMOS technology and new materials : the improvement of those technologies needs new analyses. For example using the SCANNIG CAPACITANCE MICROSCOPY could be efficient for failure analyses at 90nm and under or carrier density mapping (doping)
  • New materials, nanowires, carbon nanotubes, III-V and II-VI semiconductors, etc.: needs of specific physical characterisations.
  • New devices and systems : failure mode characterisation, reliability tests definition and realisation, and reliability parameters assessment.
Our present offer concerns the following services and equipment:
  • Physical Characterisation:
    • Sample Preparation : POLISHING of all technological levels (system assembly, die, substrates, polymers, nanostructures, carbon fibers, etc.), FIB (single and dual beam), ULTRAMICROTOMY
    • Observation : optical MICROSCOPY, SEM, TEM, HR-TEM, FIB
    • Contamination : TXRF, Mass Spectroscopy, ICP
    • Analyses : EDX, EELS, X-Rays Diffraction, Morphological Analyses, Near Field Microscopy (AFM, LFM, MFM, EFM)
  • Qualification:
    • ESD : MM / HBM / CDM / TLP
    • Latch-Up
    • Environmental tests : HTOL, ELFR, TC, HAST, HALT, HASS, etc.
    • Development of emulation boards and OLT Boards
    • Electrical Tests : Go-nogo, development of programs, transfers of test solutions to High Volume facilities etc.
    • Program management of qualification flow
  • Failure Analyses:
    • Package opening : chemicals, functional opening with heated chemicals, mechanical
    • Defect localisation : Liquid Crystal, EMMI, OBIRCH, Microscopy
    • Delayering : Chemical, Plasma, Parallel polishing
    • Expertise and Customer support for Root cause determination
    • Improvement and Solution implementation : Audits, Process modification, ESD design and solutions
Контакты:

Céline Chevalier
c.chevalier@serma.com
+33 4 38 02 36 79

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